Spectroscopic Ellipsometry for Photovoltaics

Spectroscopic Ellipsometry for Photovoltaics

Volume 2: Applications and Optical Data of Solar Cell Materials

Fujiwara, Hiroyuki; Collins, Robert

Springer International Publishing AG

10/2018

616

Dura

Inglês

9783319951379

Pré-lançamento - envio 15 a 20 dias após a sua edição

Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizations in solar cell research fields.
Introduction.- Part I: Application of Ellipsometry Technique.- Analysis of Optical and Recombination Losses in Solar Cells.- Optical Simulation of External Quantum Efficiency Spectra.- Characterization of Textured Structures.- On-line Monitoring of Photovoltaics Production.- Real Time Measurement, Monitoring, and Control of CuIn1-xGaxSe2 by Spectroscopic Ellipsometry.- Real Time and Mapping Spectroscopic Ellipsometry of Hydrogenated Amorphous and Nanocrystalline Si Solar Cells.- Part II: Optical Data of Solar-Cell Component Materials.- Inorganic Semiconductors and Passivation Layers.- Organic Semiconductors.- Organic-Inorganic Hybrid Perovskites.- Transparent Conductive Oxides.- Metals.- Substrates and Coating Layers.